Hashiguchi, Sumihisa: search on Z-Library

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1

Noise and transport characterisation of tantalum capacitors

Jan Pavelka, Josef Sikula, Petr Vasina, Vlasta Sedlakova, Munecazu Tacano, Sumihisa Hashiguchi

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 295 KB

english, 2002

2

SPIE Proceedings [SPIE Second International Symposium on Fluctuations and Noise - Maspalomas, Gran Canaria Island, Spain (Tuesday 25 May 2004)] Noise and Information in Nanoelectronics, Sensors, and Standards II - RTS in submicron MOSFETS and quantum dots

Sikula, Josef, Smulko, Janusz M., Blanter, Yaroslav, Pavelka, Jan, Sedlakova, Vlasta, Dykman, Mark I., Kish, Laszlo B., Tacano, Munecazu, Hashiguchi, Sumihisa, Toita, Masato

Year:

2004

Language:

english

File:

PDF, 213 KB

english, 2004

3

A low-drift DC amplifier utilizing thermal feedback

Shoichi Lino, Toru Sanada, Sumihisa Hashiguchi

Journal:

Electronics and Communications in Japan (Part II: Electronics))

Year:

1987

Language:

english

File:

PDF, 625 KB

english, 1987

4

Generation of 1/f spectrum by relaxation process in thin film resistors

Sumihisa Hashiguchi, Yutaka Yamagishi, Toshiyuki Fukuda, Makoto Ohki, Josef Šikulas, Petr Vašina

Journal:

Quality and Reliability Engineering International

Year:

1998

Language:

english

File:

PDF, 60 KB

english, 1998

5

[IEEE 2007 IEEE International Conference on Systems, Man and Cybernetics - Montreal, QC, Canada (2007.10.7-2007.10.10)] 2007 IEEE International Conference on Systems, Man and Cybernetics - Research and development of WEarable walKing mate system

Watanabe, Hiromi, Kotani, Shinji, Kiyohiro, Noriaki, Hashiguchi, Sumihisa

Year:

2007

Language:

english

File:

PDF, 231 KB

english, 2007

6

Measurement of 1/f noise using a contact-free current-driving scheme

Hashiguchi, Sumihisa, Suzuki, Yoshitaka

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

1982

Language:

english

File:

PDF, 858 KB

english, 1982

7

1/f noise in ion-implanted GaAs

Sumihisa Hashiguchi, Hisashi Sugiyama

Journal:

Electronics and Communications in Japan (Part II: Electronics))

Year:

1986

Language:

english

File:

PDF, 441 KB

english, 1986

8

SPIE Proceedings [SPIE Second International Symposium on Fluctuations and Noise - Maspalomas, Gran Canaria Island, Spain (Tuesday 25 May 2004)] Noise in Devices and Circuits II - LF-band noise in MOSFET in low-power operation

Hashiguchi, Sumihisa, Danneville, Francois, Bonani, Fabrizio, Kawai, Shunsuke, Ohki, Makoto, Deen, M. Jamal, Levinshtein, Michael E., Someya, Kaoru

Year:

2004

Language:

english

File:

PDF, 132 KB

english, 2004

9

SPIE Proceedings [SPIE Second International Symposium on Fluctuations and Noise - Maspalomas, Gran Canaria Island, Spain (Tuesday 25 May 2004)] Noise in Devices and Circuits II - Cross-correlation measurements in searching for a trace of the gate voltage noise in a JFET

Hashiguchi, Sumihisa, Danneville, Francois, Bonani, Fabrizio, Hosono, Shinsuke, Ohki, Makoto, Deen, M. Jamal, Levinshtein, Michael E., Tacano, Munecazu, Sikula, Josef

Year:

2004

Language:

english

File:

PDF, 252 KB

english, 2004

10

Low-Frequency Noise Measurements as a Quality Indicator for Ohmic Contacts to n-GaN

Tanuma, Nobuhisa, Tanizaki, Hirokazu, Yokokura, Saburo, Matsui, T., Hashiguchi, Sumihisa, Sikula, Josef, Tacano, Munecazu

Journal:

Materials Science Forum

Year:

2003

Language:

english

File:

PDF, 172 KB

english, 2003

11

Measurement of the Temperature Fluctuation in a Resistor Generating 1/ f Fluctuation

Hashiguchi, Sumihisa

Journal:

Japanese Journal of Applied Physics

Year:

1983

File:

PDF, 444 KB

1983

12

Hooge noise parameter of epitaxial n-GaN on sapphire

Nobuhisa Tanuma, Munecazu Tacano, Jan Pavelka, Sumihisa Hashiguchi, Josef Sikula, Toshiaki Matsui

Journal:

Solid-State Electronics

Year:

2005

Language:

english

File:

PDF, 386 KB

english, 2005

13

Electron Cyclotron Resonance Plasma Etching of n-SiC and Evaluation of Ni/n-SiC Contacts by Current Noise Measurements

Tanuma, Nobuhisa, Yasukawa, Satoshi, Yokokura, Saburo, Hashiguchi, Sumihisa, Sikula, Josef, Matsui, Toshiaki, Tacano, Munecazu

Journal:

Japanese Journal of Applied Physics

Year:

2001

Language:

english

File:

PDF, 419 KB

english, 2001

14

SPIE Proceedings [SPIE Second International Symposium on Fluctuations and Noise - Maspalomas, Gran Canaria Island, Spain (Tuesday 25 May 2004)] Fluctuations and Noise in Materials - Dependence of Hooge constant on mean free paths of materials

Tacano, Munecazu, Popovic, Dragana, Weissman, Michael B., Pavelka, Jan, Tanuma, Nobuhisa, Racz, Zoltan A., Yokokura, Saburo, Hashiguchi, Sumihisa

Year:

2004

Language:

english

File:

PDF, 469 KB

english, 2004

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